Bruker Dimension FastScan Atomic Force Microscope

Bruker Dimension FastScan

Bruker announced the Dimension FastScan Atomic Force Microscope (AFM), which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids.

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